Title :
A methodology for automated insertion of concurrent error detection hardware in synthesizable Verilog RTL
Author :
Mohanram, Kartik ; Krishna, C.V. ; Touba, Nur A.
Author_Institution :
Texas Univ., Austin, TX, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
This paper describes a methodology for automated insertion of concurrent error detection (CED) circuitry in synthesizable Verilog RTL that allows easy tradeoff between overhead and coverage. The insertion is done at the front-end of the synthesis process which is highly advantageous. Computer-aided design (CAD) tools that support the proposed methodology have been implemented and are described. The CAD tools allow the designer to select from different CED schemes that provide various cost/coverage tradeoffs. The CED circuitry is then automatically inserted into the Verilog design. Experimental results are shown which demonstrate the broad range of design points that the proposed methodology offers the designer to choose from to satisfy cost/coverage requirements. The methodology can be seamlessly integrated into the typical design flow used in industry.
Keywords :
VLSI; error detection; hardware description languages; high level synthesis; integrated circuit design; CAD tools; CED schemes; automated insertion; concurrent error detection hardware; cost/coverage tradeoffs; deep-submicron VLSI; design flow; overhead; synthesizable Verilog RTL; Circuit faults; Circuit synthesis; Computer errors; Costs; Design automation; Design methodology; Hardware design languages; Integrated circuit technology; Logic; Very large scale integration;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1009906