Automated test development and test time reduction for RF subsystems

Increasing percentage of test cost within the overall manufacturing cost for RF sub-systems results in a need for new, low-cost, and efficient test development methods. A methodology for automating test development for RF systems is presented. Test time reduction is achieved by selecting test signal attributes that can target several parameters at once. Due to its high computational efficiency, the tool can be applied multiple times at early design stages; thus enabling parallel test and design flow.