Title :
Automated test development and test time reduction for RF subsystems
Author :
Ozev, Sule ; Orailoglu, Alex ; Haggag, Hosam
Author_Institution :
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
Increasing percentage of test cost within the overall manufacturing cost for RF sub-systems results in a need for new, low-cost, and efficient test development methods. A methodology for automating test development for RF systems is presented. Test time reduction is achieved by selecting test signal attributes that can target several parameters at once. Due to its high computational efficiency, the tool can be applied multiple times at early design stages; thus enabling parallel test and design flow.
Keywords :
automatic testing; design for testability; integrated circuit testing; network parameters; production testing; RF subsystems; automated test development; computational efficiency; design stages; efficient test development methods; overall manufacturing cost; parallel test/design flow; test cost; test signal attributes; test time reduction; Automatic testing; Bit error rate; Circuit simulation; Circuit testing; Costs; Linearity; Phase noise; Radio frequency; Semiconductor device testing; System testing;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1009907