Title :
High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST
Author :
Mukherjee, Nilanjan ; Pogiel, Artur ; Rajski, Janusz ; Tyszer, Jerzy
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR
Abstract :
The paper presents a BIST-based fault diagnosis scheme that can be used to identify a variety of failures in embedded memory arrays. The proposed solution employs flexible test logic to record test responses at the system speed with no interruptions of a BIST session. It offers a simple test flow and enables detection of time-related faults. Furthermore, the way the test responses are processed allows accurate reconstruction of error bitmaps.
Keywords :
built-in self test; data compression; fault diagnosis; integrated memory circuits; logic testing; embedded memory arrays; embedded memory built-in self-test; error bitmaps reconstruction; failure data compression; fault diagnosis scheme; flexible test logic; high throughput diagnosis; Automatic testing; Bandwidth; Built-in self-test; Circuit faults; Circuit testing; Fault detection; Fault diagnosis; Logic testing; System testing; Throughput;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700554
