• DocumentCode
    1733610
  • Title

    Low cost testing of multi-GBit device pins with ATE assisted loopback instrument

  • Author

    Fritzsche, William A. ; Haque, Asim E.

  • Author_Institution
    Credence Syst. Corp., Milpitas, CA
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Loopback has always been a choice in testing multi-GBit device pins. It typically involves compromise in test coverage. This paper describes an instrument providing low-cost test capability for these pins which eliminates test compromises.
  • Keywords
    automatic testing; integrated circuit testing; ATE assisted loopback instrument; low-cost test capability; multi-GBit device pins; Built-in self-test; Circuit testing; Costs; Hardware; Instruments; Jitter; Pins; Power system modeling; Protocols; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700558
  • Filename
    4700558
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1733610