Title :
SAT-based State Justification with Adaptive Mining of Invariants
Author :
Wu, Weixin ; Hsiao, Michael S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA
Abstract :
We present a new approach to intelligently mine three types of invariants from a sequential circuit to significantly improve SAT-based state justification. We adaptively generate mining databases targeting on the hard-to-reach corner-case states, from which global invariants, target state related invariants, and observability-don´t-care extended invariants are mined. Each mined invariant involves two or more signals that span across multiple time-frames, which capture the knowledge of the state spaces related to a target state. These invariants are then checked for their validity, and they can significantly increase the deductive power of the instance by pruning a larger portion of the search space. Experimental results show that more than an order of magnitude performance improvement can be obtained when justifying hard-to-justify states.
Keywords :
computability; data mining; sequential circuits; State Justification; adaptive mining of invariants; mining databases; sequential circuit; Automatic test pattern generation; Circuit synthesis; Circuit testing; Databases; Logic arrays; Logic circuits; Observability; Packaging; Sequential circuits; State-space methods;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700567