• DocumentCode
    1733883
  • Title

    Measurement Repeatability for RF Test Within the Load-board Constraints of High Density and Fine Pitch SOC Applications

  • Author

    Warwick, Thomas P. ; Rivera, Gustavo ; Waite, David ; Russell, James ; Smith, Jeffrey

  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Fine pitch SOC devices with multiple RF ports force specific board technologies, which increase repeatability issues for RF measurements. This paper analyzes some of the causes of measurement repeatability issues and suggests possible solutions.
  • Keywords
    system-on-chip; RF test; fine pitch SOC; high density SOC; load-board constraints; measurement repeatability; multiple RF ports force specific board; Circuit testing; Density measurement; Force measurement; Packaging; Production; Radio frequency; Semiconductor device measurement; Sockets; System-on-a-chip; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700570
  • Filename
    4700570
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1733883