DocumentCode
1733915
Title
A New Method of Testability Prediction on Model and Probability Analysis
Author
Zhiyong, Yang ; Xu Aiqiang ; Shuangcheng, Niu ; Ziling, Wang
Author_Institution
Second Artillery Eng. Acad., Xi´´an
fYear
2007
Abstract
For improving the accuracy of fault-test dependency analysis and test prediction, we introduce two new additional properties into multi-signal model and give a new method of testability prediction on refined multi-signal model. The paper illustrates the method and procedure of testability prediction in two ways. The new method can improve the accuracy of estimating FDR and FIR evidently.
Keywords
automatic testing; fault diagnosis; probability; fault detection rate; fault isolation rate; fault-test dependency analysis; fault-test dependency matrix; multisignal model; probability analysis; testability prediction; Aerospace engineering; Electronic equipment testing; Fault detection; Finite impulse response filter; Instruments; Knowledge representation; Logic testing; Predictive models; Set theory; System testing; FDR; FIR; diagnostic logic; fault-test dependency matrix; multi-signal model; testability prediction;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-1136-8
Electronic_ISBN
978-1-4244-1136-8
Type
conf
DOI
10.1109/ICEMI.2007.4351087
Filename
4351087
Link To Document