DocumentCode :
1733983
Title :
Coupled electrical and thermal 3D IC centric microfluidic heat sink design and technology
Author :
Zhang, Yue ; King, Calvin R., Jr. ; Zaveri, Jesal ; Kim, Yoon Jo ; Sahu, Vivek ; Joshi, Yogenda ; Bakir, Muhannad S.
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2011
Firstpage :
2037
Lastpage :
2044
Abstract :
Through-silicon via (TSV) technology, an enabler for 3D ICs, has evolved, enabling thinner and shorter TSVs within substantially thinned wafers to achieve faster interconnects, large bandwidth density, and low power consumption. Yet, heat dissipation in 3D ICs becomes more and more challenging, especially in applications that require stacking of multiple processor and memory chips. Microfluidic cooling has been proposed as a solution to reject heat from 3D stacks that contain processor chips. However, current liquid cooling technology inevitably increases the wafer thickness, which is contrary to TSV technology trend. To date, little work has been done to optimize heat sink design to benefit TSV performance, and no attempt has been made to analyze the corresponding impact of a particular heat sink design on the performance of the electrical TSVs. A heat sink design without consideration of TSV performance can greatly diminish the advantages of 3D ICs. This paper presents a holistic cooling solution for 3D ICs, which not only meets thermal requirements, but also minimizes TSV parasitics that impact latency, bandwidth density, and power consumption. This paper will report: a) the design of a 3D-centric heat sink, b) the fabrication of the heat sink and associated high aspect ratio integrated TSVs, c) the thermal testing of the liquid-cooled heat sink and comparison to air-cooled heat sink, and d) the impact of the heat sink geometry on TSV capacitance.
Keywords :
heat sinks; microfluidics; three-dimensional integrated circuits; 3D stack; 3D-centric heat sink design; TSV capacitance; TSV technology trend; air-cooled heat sink; bandwidth density; coupled electrical 3D IC centric microfluidic heat sink design; electrical TSV performance; heat dissipation; heat sink geometry; high aspect ratio integrated TSV; holistic cooling solution; latency; liquid cooling technology; liquid-cooled heat sink; memory chip; microfluidic cooling; multiple processor; power consumption; processor chip; thermal 3D IC centric microfluidic heat sink design; thermal requirement; thermal testing; thinned wafer; through-silicon via technology; wafer thickness; Heat sinks; Resistance heating; Thermal resistance; Three dimensional displays; Through-silicon vias; 3D IC; Electrical model of TSV; microchannel heat sink; micropin-fin heat sink; through-silicon via (TSV);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
978-1-61284-497-8
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2011.5898797
Filename :
5898797
Link To Document :
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