Title :
Analog testing using real zero crossing technique
Author :
Seireg, Reda ; Elnaby, M. M Abd ; Emad, N. Ai ; El Refaie, Osama
Author_Institution :
Dept. of Comput. Sci., El Shorouk Acad., Egypt
Abstract :
The functional digital testing is defined as a black and white test [N. Nagi, et al., June 1998, B. Vinnakota, 1998] by other word, it can determine faulty and non faulty boards. But the analog faults are not. The faulty and non-faulty are relatively defined depending on tolerance allowed for non-faulty boards. In this paper, we introduce a new universal method based on zero crossing technique to evaluate the faulty circuits. The effect of tolerance form 0 to ±20% in frequency and amplitude has been formulated. The simulation has been done by MATLAB. The results indicate the simplicity of the proposed method.
Keywords :
analogue circuits; fault tolerance; printed circuit testing; printed circuits; MATLAB; amplitude; analog testing; fault tolerance; faulty board; faulty circuits; frequency; nonfaulty board; real zero crossing technique; Artificial intelligence; Circuit faults; Circuit testing; Compaction; Computer science; Frequency; MATLAB; Polynomials; Sampling methods; System testing;
Conference_Titel :
Radio Science Conference, 2003. NRSC 2003. Proceedings of the Twentieth National
Print_ISBN :
977-5031-75-3
DOI :
10.1109/NRSC.2003.1217359
