DocumentCode
1734272
Title
A new approach to test and diagnose the faulty logic blocks in FPGAs
Author
Elsayed, Amr ; Elbably, Mohamed ; Elbolok, Hatem
Author_Institution
Fac. of Eng., Helwan Univ., Cairo, Egypt
fYear
2003
Lastpage
42378
Abstract
The field programmable gate arrays (FPGAs) are widely used in the hardware implementation of many designed circuits. We introduce a new diagnosis procedure to detect the faulty nodes inside the FPGA and identify the faulty configurable logic blocks (CLBs) inside the faulty nodes. This procedure is based on Chwa-Hakimi model which provides the power to increase the capability of detection. A shifting technique is used to save the off-chip memory and to make the process of test and diagnosis is faster.
Keywords
built-in self test; fault diagnosis; field programmable gate arrays; logic design; logic testing; Chwa-Hakimi model; FPGA; detection capability; faulty configurable logic blocks; field programmable gate arrays; hardware implementation; off-chip memory; shifting technique; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault diagnosis; Field programmable gate arrays; Hardware; Logic functions; Logic testing; Programmable logic arrays;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Science Conference, 2003. NRSC 2003. Proceedings of the Twentieth National
Print_ISBN
977-5031-75-3
Type
conf
DOI
10.1109/NRSC.2003.1217361
Filename
1217361
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