• DocumentCode
    1734338
  • Title

    Novel ZnO nanowires/silicon hierarchical structures for superhydrophobic, low reflection, and high efficiency solar cells

  • Author

    Liu, Yan ; Lin, Ziyin ; Moon, Kyoung Sik ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2011
  • Firstpage
    2114
  • Lastpage
    2118
  • Abstract
    For current solar cell technique, low conversion efficiency is the main limiting factor. A large portion of energy loss during solar cell operation could be attributed to optical loss, namely reflection loss of the incoming light. To reduce the reflection loss, surface texturing and antireflection coatings are most commonly used strategies. We report a novel hierarchical structure of integrating ZnO nanowire arrays on Si micropyramids as an effective anti-reflection layer for improving the energy conversion efficiency. This structure displays a broadband reflection suppression in the 300-1200 nm range, with an average weighted reflectance of 3.2%, much lower than the previously reported 6.6% reflectance of tapered ZnO nanostructures on planar surfaces. Sunrays 1.3 simulation was employed for optimizing and a better understanding of the effect of hierarchical structure in reflectance suppression. In addition, the surface modification enables a self cleaning property that will prevent the blocking of light by dust particles on solar panels.
  • Keywords
    hydrophobicity; nanowires; solar cells; anti-reflection layer; micropyramids; nanowires; silicon hierarchical structures; solar panels; superhydrophobic solar cells; Nanowires; Photovoltaic cells; Reflection; Reflectivity; Silicon; Surface morphology; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898810
  • Filename
    5898810