Title :
Frequency and Power Correlation between At-Speed Scan and Functional Tests
Author :
Sde-Paz, Shlomi ; Salomon, Eyal
Author_Institution :
Freescale Semicond. Israel Ltd., Herzylia
Abstract :
At-speed scan is a key technique in modern IC testing. One of its drawbacks, with respect to functional tests, is its excessive power consumption leading to voltage drop and frequency degradation. This paper discusses the frequency and power correlation between At-speed scan and functional tests. The influence of voltage drop on frequency is demonstrated by silicon measurements and supporting simulation results. The localized nature of the voltage drop as well as impedance component analysis are presented. Additionally, the need for power aware scan patterns is also discussed. Suggestions for achieving a higher correlation between At-speed scan and functional patterns, with respect to power consumption, are offered.
Keywords :
electric potential; integrated circuit testing; At-speed scan; excessive power consumption; frequency degradation; functional tests; impedance component analysis; modern IC testing; power aware scan patterns; power correlation; silicon measurements; voltage drop; Automatic test pattern generation; Automatic testing; Degradation; Energy consumption; Frequency measurement; Integrated circuit testing; Logic testing; Semiconductor device testing; Silicon; Voltage;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700586
