Title :
Study of total dose effect on a 2.4 GHz CMOS VCO
Author :
Adel, Samer ; Kayed, Somaya ; Ragaie, Hani
Author_Institution :
Dept. of Electron. & Commun. Eng., Ain Shams Univ., Cairo, Egypt
Abstract :
This work studies the effect of total ionization dose on a 2.4 GHz CMOS VCO for Bluetooth applications. The technology used is 0.6μ from AMS and the transistor simulation model is BSIM3v3. The VCO has a tuning range of 16% and phase noise of -115 dBc/Hz at 1 MHz. Radiation hard by layout was used to overcome the total ionization dose effects.
Keywords :
Bluetooth; CMOS integrated circuits; UHF integrated circuits; UHF oscillators; phase noise; radiation hardening (electronics); voltage-controlled oscillators; 0.6 mum; 1 MHz; 2.4 GHz; Austria Mikro System; BSIM3v3 model; Bluetooth applications; CMOS; VCO; complementary metal-oxide-semiconductor; phase noise; radiation-hard layout; total ionization dose; transistor simulation model; voltage-controlled oscillators; CMOS technology; Circuits; Inductors; Ionization; Phase noise; Radiation effects; Radio frequency; Space technology; Tuning; Voltage-controlled oscillators;
Conference_Titel :
Radio Science Conference, 2003. NRSC 2003. Proceedings of the Twentieth National
Print_ISBN :
977-5031-75-3
DOI :
10.1109/NRSC.2003.1217373
