Title :
Architecture for Testing Multi-Voltage Domain SOC
Author :
Souef, Laurent ; Eychenne, Christophe ; Alié, Emmanuel
Author_Institution :
ST NXP Wireless Semicond. Sophia, Valbonne
Abstract :
In portable applications power consumption is a key parameter to commercial success. Mobile phone standby time, talk time and MP3 player play time are key customer parameters. With ever decreasing technology nodes, this static leakage current is becoming predominant. It is becoming a real issue for standalone devices. One of the solutions is to embed power switches in the device in order to switch off the blocks that are not used. The challenge is then to test and validate those power switches on the production line. This paper shows a practical case study, detailing the implemented DFT architecture solutions and the measurements achieved on test systems.
Keywords :
discrete Fourier transforms; integrated circuit testing; system-on-chip; DFT architecture solutions; MP3 player play time; embed power switches; integrated circuits testing; mobile phone standby time; multivoltage domain SOC testing; portable applications power consumption; standalone devices; talk time; Circuit testing; Digital audio players; Energy consumption; Leakage current; Phasor measurement units; Power measurement; Semiconductor device measurement; Semiconductor device testing; Software libraries; Switches;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700592
