DocumentCode
1734640
Title
Architecture for Testing Multi-Voltage Domain SOC
Author
Souef, Laurent ; Eychenne, Christophe ; Alié, Emmanuel
Author_Institution
ST NXP Wireless Semicond. Sophia, Valbonne
fYear
2008
Firstpage
1
Lastpage
10
Abstract
In portable applications power consumption is a key parameter to commercial success. Mobile phone standby time, talk time and MP3 player play time are key customer parameters. With ever decreasing technology nodes, this static leakage current is becoming predominant. It is becoming a real issue for standalone devices. One of the solutions is to embed power switches in the device in order to switch off the blocks that are not used. The challenge is then to test and validate those power switches on the production line. This paper shows a practical case study, detailing the implemented DFT architecture solutions and the measurements achieved on test systems.
Keywords
discrete Fourier transforms; integrated circuit testing; system-on-chip; DFT architecture solutions; MP3 player play time; embed power switches; integrated circuits testing; mobile phone standby time; multivoltage domain SOC testing; portable applications power consumption; standalone devices; talk time; Circuit testing; Digital audio players; Energy consumption; Leakage current; Phasor measurement units; Power measurement; Semiconductor device measurement; Semiconductor device testing; Software libraries; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700592
Filename
4700592
Link To Document