• DocumentCode
    1734640
  • Title

    Architecture for Testing Multi-Voltage Domain SOC

  • Author

    Souef, Laurent ; Eychenne, Christophe ; Alié, Emmanuel

  • Author_Institution
    ST NXP Wireless Semicond. Sophia, Valbonne
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    In portable applications power consumption is a key parameter to commercial success. Mobile phone standby time, talk time and MP3 player play time are key customer parameters. With ever decreasing technology nodes, this static leakage current is becoming predominant. It is becoming a real issue for standalone devices. One of the solutions is to embed power switches in the device in order to switch off the blocks that are not used. The challenge is then to test and validate those power switches on the production line. This paper shows a practical case study, detailing the implemented DFT architecture solutions and the measurements achieved on test systems.
  • Keywords
    discrete Fourier transforms; integrated circuit testing; system-on-chip; DFT architecture solutions; MP3 player play time; embed power switches; integrated circuits testing; mobile phone standby time; multivoltage domain SOC testing; portable applications power consumption; standalone devices; talk time; Circuit testing; Digital audio players; Energy consumption; Leakage current; Phasor measurement units; Power measurement; Semiconductor device measurement; Semiconductor device testing; Software libraries; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700592
  • Filename
    4700592