• DocumentCode
    1734699
  • Title

    Distributed Embedded Logic Analysis for Post-Silicon Validation of SOCs

  • Author

    Ko, Ho Fai ; Kinsman, Adam B. ; Nicolici, Nicola

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Post-silicon validation is used to identify design errors in silicon. Its main limitation is real-time observability of the circuit´s internal nodes. In this paper, we introduce a novel design-for-debug architecture which automatically allocates distributed trace buffers to handle debug data acquisition requests from multiple sources located in different cores. Using resource-efficient and intelligent control placed on-chip, we show how real-time observability can be improved, thus helping bridge the gap between pre-silicon verification and post-silicon validation for SOC designs.
  • Keywords
    integrated circuit design; integrated circuit testing; logic design; monolithic integrated circuits; system-on-chip; debug data acquisition; design error identification; design-for-debug architecture; distributed embedded logic analysis; distributed trace buffer allocation; intelligent control placed on-chip; post-silicon validation; presilicon verification; real-time observability; system-on-chip design; Circuits; Computer bugs; Costs; Data acquisition; Design for disassembly; Logic design; Observability; Silicon; System-on-a-chip; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700594
  • Filename
    4700594