Title :
Ground-Semiconductor-Ground Guiding Phenomena of Noise Coupling in CMOS Substrate
Author :
Wu, Hsien-Hung ; Tzuang, Ching-Kuang C.
Author_Institution :
SoC Technol. Center, Ind. Technol. Res. Inst., Hsinchu
Abstract :
Ground-semiconductor-ground (GSG) transmission line (TL) is proposed and investigated thoroughly for the assessment of CMOS signal integrity problem at multi-GHz frequency regime. The GSG TL models the practical implementation of CMOS logic layout, which consists of power line, Nwell line (semiconductor), Pwell line (semiconductor), and ground line. Rigorous field-theory analyses and experiments show that GSG TL supports the CPW (coplanar waveguide) mode for the particular case study, which also demonstrate the slow-wave factor can be as high as 50 at 1 GHz and decrease to 10 at 10 GHz, pointing to the fact that the slow-wave phenomena will be more pronounced for CMOS electronics operated beyond tens of GHz
Keywords :
CMOS integrated circuits; CMOS logic circuits; transmission lines; CMOS logic layout; CMOS signal integrity; CMOS substrate; Nwell line; Pwell line; coplanar waveguide; ground line; ground-semiconductor-ground guiding phenomena; ground-semiconductor-ground transmission line; noise coupling; power line; slow-wave factor; CMOS logic circuits; Coplanar waveguides; Couplings; Frequency; Power transmission lines; Semiconductor device modeling; Semiconductor device noise; Semiconductor waveguides; Substrates; Waveguide components; CMOS; guiding phenomena; signal integrity;
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2007 Topical Meeting on
Conference_Location :
Long Beach, CA
Print_ISBN :
0-7803-9764-9
Electronic_ISBN :
0-7803-9765-7
DOI :
10.1109/SMIC.2007.322775
