Title :
Functional Test and Speed/Power Sorting of the IBM POWER6 and Z10 Processors
Author :
Pham, Tung N. ; Clougherty, Frances ; Salem, Gerard ; Crafts, James M. ; Tetzloff, Jon ; Moczygemba, Pamela ; Skergan, Timothy M.
Author_Institution :
Syst. & Technol. Group Dev., IBM, NY
Abstract :
The 5 GHz IBM POWER6 processor (P6) and newest Z10 4.4 GHz processor utilized a custom combination of structural and functional testing delivering improved test costs and accelerated SPQL learning over previous IBM processor generations.
Keywords :
microprocessor chips; IBM POWER6 processor; SPQL learning; Z10 processor; frequency 4.4 GHz; frequency 5 GHz; functional testing; speed/power sorting; Circuit faults; Circuit testing; Communication system control; Cost function; Logic arrays; Logic programming; Logic testing; Sorting; System testing; System-on-a-chip;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700598
