DocumentCode :
1734790
Title :
Transition Test on UltraSPARC- T2 Microprocessor
Author :
Chen, Liang-Chi ; Dickinson, Paul ; Mantri, Prasad ; Gala, Murali ; Dahlgren, Peter ; Bhattacharya, Subhra ; Caty, Olivier ; Woodling, Kevin ; Ziaja, Thomas ; Curwen, David ; Yee, Wendy ; Su, Ellen ; Gu, Guixiang ; Nguyen, Tim
Author_Institution :
Sun Microsyst., Sunnyvale, CA
fYear :
2008
Firstpage :
1
Lastpage :
10
Abstract :
Sun´s T2 processor transition test methodology, verification and silicon debug are described. We illustrate our test mechanism, test sequence, test development, and the verification of this mechanism in silicon. Methods to identify slow flops, diagnose gate dominated paths, excite long delay for wire dominated paths, and find essential patterns for speed characterization are presented. In addition, a method is developed for recovering devices with a fewer good processor cores. All these applications together make transition test a much more powerful tool.
Keywords :
microprocessor chips; Sun UltraSPARC T2 microprocessor; silicon debug; transition test; Automatic test pattern generation; Circuit testing; Clocks; Delay; Frequency; Logic testing; Microprocessors; Phase locked loops; Silicon; Sun;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2008.4700599
Filename :
4700599
Link To Document :
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