Title :
Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms
Author :
Srinivasan, Ganesh ; Chao, Hui-Chuan ; Taenzler, Friedrich
Author_Institution :
Texas Instrum. Inc., Dallas, TX
Abstract :
Present day needs of RF IC manufactures for EVM tests in production testing from engineering and customer perspectives strongly demands massive parallel testing. This paper presents an industry development and deployment approach of octal-site, OFDM based broadband EVM tests on low-cost ATE platforms. Results obtained from an octal-site EVM solution for a WLAN transceiver is presented to validate the approach. The effects of repeatability and isolation of these tests in multi-site configuration are discussed. Also, a study of test time and test cost is presented to justify deployment of these tests in production.
Keywords :
OFDM modulation; automatic test equipment; transceivers; wireless LAN; ATE platform; OFDM based broadband EVM test; WLAN transceiver; automatic test equipment; error vector magnitude; octal-site EVM test; orthogonal frequency division multiplexing; wireless LAN; Costs; Integrated circuit testing; Manufacturing; OFDM; Production; Radio frequency; Radiofrequency integrated circuits; System testing; Transceivers; Wireless LAN;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700601
