Title :
Modeling Test Escape Rate as a Function of Multiple Coverages
Author :
Butler, Kenneth M. ; Carulli, John M., Jr. ; Saxena, Jayashree
Author_Institution :
Texas Instrum., Dallas, TX
Abstract :
The Williams and Brown model has long been the gold standard for estimating test escape rate as a function of yield and fault coverage. However, today´s test programs have a number of differing test types, often with overlapping failing unit detections. This paper details the development of a method which permits test escape rate predictions based on product yield and multiple overlapping test coverages.
Keywords :
design for testability; fault diagnosis; integrated circuit modelling; integrated circuit testing; integrated circuit yield; Williams and Brown model; design for test; fault coverage; integrated circuit; multiple overlapping test coverages; product yield; test escape rate modeling; test escape rate prediction; test program; Automatic testing; Circuit testing; Design engineering; Design for testability; Integrated circuit testing; Life testing; Production; Software testing; Virtual manufacturing; Yield estimation;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700605
