Abstract :
Recently, the sampling frequency and resolution of analog-to-digital converters (ADCs) embedded in mixed signal system-on-chips (SOCs) has been increasing. As a result, testing the dynamic performance of these ADCs is a challenge for ATE because the analog signal source instrument, typically an arbitrary waveform generator (AWG), must generate a clean sine waveform with an output frequency of around 30 MHz to 100 MHz. This paper introduces a method to generate a very low distortion sine waveform, which far exceeds the specification of the AWG used, by applying a reverse phase component to the distortion. Actual experiments show this method reduces the 2nd order harmonic distortion by 31 dB and 3rd order harmonic distortion by 25 dB at a 50 MHz AWG output frequency. With this method, testing the dynamic performance of mixed signal SOCs and high frequency, high resolution ADCs can be accomplished using a legacy, low cost AWG.
Keywords :
analogue-digital conversion; automatic test equipment; function generators; system-on-chip; analog signal source instrument; analog-to-digital converters; arbitrary waveform generator; automatic test equipment; harmonic distortion; high frequency sine waveform; mixed signal SOC; mixed signal system-on-chips; reverse phase component; very low distortion; Analog-digital conversion; Frequency conversion; Harmonic distortion; Instruments; Phase distortion; Sampling methods; Signal generators; Signal resolution; System-on-a-chip; Testing;
