Title :
Leveraging IEEE 1641 for Tester-Independent ATE Software
Author :
Wagenen, Bethany Van ; Vollmar, Jon ; Thornton, Dan
Author_Institution :
Teradyne Inc., North Reading, MA
Abstract :
Three critical issues for semiconductor test development are test reuse, portability, and translation from design information. In the military/aerospace market, the IEEE standard for signal and test definition (IEEE 1641-2004) addresses similar requirements and may be highly relevant to the semi-test domain. The authors evaluate this standard´s applicability to semi-test mixed signal use cases for possible direct use as, or inspiration for, a hardware-independent tester interface for ATE.
Keywords :
electronic engineering computing; semiconductor device testing; IEEE 1641; hardware-independent tester interface; military-aerospace market; semiconductor test development; semitest domain; tester-independent ATE software; Aerospace industry; Aerospace testing; Instruments; Mathematical model; Military standards; Semiconductor device testing; Software standards; Software testing; Standards development; System testing;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700608
