Title :
Modeling of carbon nanotube (CNT) interconnects
Author :
Yin, Wen-Yan ; Zhao, Wen-Sheng
Abstract :
Metallic carbon nanotube (CNT) interconnect has been regarded as a competitive candidate for next generation of interconnect. The equivalent circuit models of CNTs are investigated in this paper. Based on these models, the performance of CNT interconnects is predicted in comparison with Cu wire counterpart. Further, crosstalk effects in single-and double-walled CNT (SWCNT & DWCNT) bundle interconnect architectures are examined. It is found that compared with SWCNT bundle, the DWCNT one can lead to a reduction of crosstalk-induced time delay. Finally, electrothermal characterization of a metallic SWCNT interconnect array is performed, with self-heating effect treated carefully.
Keywords :
carbon nanotubes; copper; crosstalk; equivalent circuits; integrated circuit interconnections; C; DWCNT; SWCNT; bundle interconnect architectures; carbon nanotube interconnects; copper wire; crosstalk-induced time delay; electrothermal characterization; equivalent circuit; metallic carbon nanotube; single-and double-walled CNT; Arrays; Capacitance; Carbon nanotubes; Copper; Crosstalk; Integrated circuit interconnections; Integrated circuit modeling;
Conference_Titel :
Signal Propagation on Interconnects (SPI), 2011 15th IEEE Workshop on
Conference_Location :
Naples
Print_ISBN :
978-1-4577-0466-6
Electronic_ISBN :
978-1-4577-0465-9
DOI :
10.1109/SPI.2011.5898845