• DocumentCode
    1735126
  • Title

    Modeling of carbon nanotube (CNT) interconnects

  • Author

    Yin, Wen-Yan ; Zhao, Wen-Sheng

  • fYear
    2011
  • Firstpage
    79
  • Lastpage
    82
  • Abstract
    Metallic carbon nanotube (CNT) interconnect has been regarded as a competitive candidate for next generation of interconnect. The equivalent circuit models of CNTs are investigated in this paper. Based on these models, the performance of CNT interconnects is predicted in comparison with Cu wire counterpart. Further, crosstalk effects in single-and double-walled CNT (SWCNT & DWCNT) bundle interconnect architectures are examined. It is found that compared with SWCNT bundle, the DWCNT one can lead to a reduction of crosstalk-induced time delay. Finally, electrothermal characterization of a metallic SWCNT interconnect array is performed, with self-heating effect treated carefully.
  • Keywords
    carbon nanotubes; copper; crosstalk; equivalent circuits; integrated circuit interconnections; C; DWCNT; SWCNT; bundle interconnect architectures; carbon nanotube interconnects; copper wire; crosstalk-induced time delay; electrothermal characterization; equivalent circuit; metallic carbon nanotube; single-and double-walled CNT; Arrays; Capacitance; Carbon nanotubes; Copper; Crosstalk; Integrated circuit interconnections; Integrated circuit modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Propagation on Interconnects (SPI), 2011 15th IEEE Workshop on
  • Conference_Location
    Naples
  • Print_ISBN
    978-1-4577-0466-6
  • Electronic_ISBN
    978-1-4577-0465-9
  • Type

    conf

  • DOI
    10.1109/SPI.2011.5898845
  • Filename
    5898845