DocumentCode :
1735140
Title :
Impact of parameters variability on the electrical performance of carbon nanotube interconnects
Author :
Stievano, I.S. ; Manfredi, P. ; Canavero, F.G.
Author_Institution :
Dip. Elettron., Politec. di Torino, Torino, Italy
fYear :
2011
Firstpage :
83
Lastpage :
86
Abstract :
This paper addresses the simulation of carbon nanotube interconnects with the inclusion of the effects of parameter uncertainties due to the fabrication process. The proposed approach is based on the available state-of-the-art models of nanointerconnects and on the expansion of the voltage and current variables in terms of orthogonal components, leading to an enhanced stochastic model. The method offers comparable accuracy and improved efficiency in computing parameters variability effects on system responses with respect to conventional methods like Monte Carlo. A realistic application example involving the frequency-domain analysis of an high-speed nanointerconnect concludes the paper.
Keywords :
carbon nanotubes; frequency-domain analysis; stochastic processes; carbon nanotube interconnect simulation; electrical performance; fabrication process; frequency-domain analysis; nanointerconnect; parameters variability; stochastic model; Carbon nanotubes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Propagation on Interconnects (SPI), 2011 15th IEEE Workshop on
Conference_Location :
Naples
Print_ISBN :
978-1-4577-0466-6
Electronic_ISBN :
978-1-4577-0465-9
Type :
conf
DOI :
10.1109/SPI.2011.5898846
Filename :
5898846
Link To Document :
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