DocumentCode :
1735296
Title :
Iterative learning control for near-field scanning optical microscope applications
Author :
Chaffe, Marian P. ; Pao, Lucy Y.
Author_Institution :
Dept. of Electr., Comput., & Energy Eng., Univ. of Colorado Boulder, Boulder, CO, USA
fYear :
2011
Firstpage :
1075
Lastpage :
1080
Abstract :
Near-field scanning optical microscopes (NSOMs) construct images from optical properties recorded by a scanning probe as a sample is passed under a solid immersion lens (SIL) and a laser source. An air gap between the SIL and the sample must be maintained at a distance given in nanometers that is less than the wavelength of the laser source. Regulation of the air gap demands an accurate and fast controller. While lead-lag compensation has been successfully implemented as the feedback controller, the addition of feedforward or iterative learning control (ILC) can offer improved transient performance with significantly reduced overshoot. A serial ILC design is implemented upon a closed-loop system and the resulting performance is evaluated.
Keywords :
closed loop systems; control system synthesis; feedback; iterative methods; learning systems; optical microscopes; NSOM; closed-loop system; feedback controller; iterative learning control; lead-lag compensation; near-field scanning optical microscope applications; scanning probe; solid immersion lens; Adaptive control; Approximation methods; Computational modeling; Mathematical model; Media; Optical feedback; Trajectory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control Applications (CCA), 2011 IEEE International Conference on
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4577-1062-9
Electronic_ISBN :
978-1-4577-1061-2
Type :
conf
DOI :
10.1109/CCA.2011.6044386
Filename :
6044386
Link To Document :
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