Title :
Dual-adaptive feedforward control for raster tracking with applications to AFMs
Author :
Butterworth, Jeffrey A. ; Pao, Lucy Y. ; Abramovitch, Daniel Y.
Author_Institution :
Dept. of Electr., Comput., & Energy Eng., Univ. of Colorado, Boulder, CO, USA
Abstract :
We evaluate the performance of a dual-adaptive feedforward control architecture applied to the raster scan of a piezo-based positioning system. In previous work [1], we introduced the adaptive-delay algorithm that improved the tracking performance of the feedforward plant-injection architecture. The key benefit of the adaptive-delay algorithm is the adaptation calculation that does not require knowledge of plant parameters. In [1], the algorithm uses model-inverse-based feedforward control to increase raster-tracking bandwidth. It is well known that model-inverse-based feedforward control designs can perform poorly in the presence of large model variation or uncertainty. System identification methods reveal that the frequency response of our piezoscanner includes a large amount of variation as the user requests various operating points within the stage´s range. As a result, tracking performance degrades as we vary from the conditions with which the model was identified. To correct for this, we combined the adaptive-delay algorithm with partial-parameter adaptation that updates critically variant parameters. This partnership of adaptive feedforward controllers improved experimental tracking results and robustness to model uncertainties.
Keywords :
adaptive control; atomic force microscopy; delays; feedforward; physical instrumentation control; position control; stability; AFM; adaptive-delay algorithm; atomic force microscope; dual-adaptive feedforward control; model uncertainty; partial-parameter adaptation; piezo-based positioning system; raster scan; raster tracking; robustness; Adaptation models; Computer architecture; Delay; Estimation; Feedforward neural networks; TV;
Conference_Titel :
Control Applications (CCA), 2011 IEEE International Conference on
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4577-1062-9
Electronic_ISBN :
978-1-4577-1061-2
DOI :
10.1109/CCA.2011.6044387