• DocumentCode
    1735394
  • Title

    I/sub CCQ/: a test method for analogue VLSI based on current monitoring

  • Author

    Van Lammeren, Joop P M

  • Author_Institution
    Philips Semicond., Nijmegen, Netherlands
  • fYear
    1997
  • Firstpage
    24
  • Lastpage
    28
  • Abstract
    This paper introduces a test method for analogue (parts of) ICs that determines whether an IC is good or not by measuring the currents flowing through its constituent circuits. The I/sub CCQ/ test method is not a full functional test. It is aimed primarily at finding faulty circuits during wafer testing. Both static and dynamic currents can be tested with this test method.
  • Keywords
    VLSI; I/sub CCQ/ test method; IC test method; analogue VLSI; current monitoring; dynamic currents; faulty circuits; static currents; wafer testing; Bonding; CMOS digital integrated circuits; Circuit testing; Current measurement; Current supplies; Integrated circuit testing; Monitoring; Switches; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-8186-8123-3
  • Type

    conf

  • DOI
    10.1109/IDDQ.1997.633008
  • Filename
    633008
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1735394