Title :
I/sub CCQ/: a test method for analogue VLSI based on current monitoring
Author :
Van Lammeren, Joop P M
Author_Institution :
Philips Semicond., Nijmegen, Netherlands
Abstract :
This paper introduces a test method for analogue (parts of) ICs that determines whether an IC is good or not by measuring the currents flowing through its constituent circuits. The I/sub CCQ/ test method is not a full functional test. It is aimed primarily at finding faulty circuits during wafer testing. Both static and dynamic currents can be tested with this test method.
Keywords :
VLSI; I/sub CCQ/ test method; IC test method; analogue VLSI; current monitoring; dynamic currents; faulty circuits; static currents; wafer testing; Bonding; CMOS digital integrated circuits; Circuit testing; Current measurement; Current supplies; Integrated circuit testing; Monitoring; Switches; Very large scale integration; Voltage;
Conference_Titel :
IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-8186-8123-3
DOI :
10.1109/IDDQ.1997.633008
