Title :
A design for test proposal for improving dynamic current testing reliability on regenerative sense amplifiers
Author :
Arguelles, J. ; Bracho, S.
Author_Institution :
TEISA Dept., Cantabria Univ., Santander, Spain
Abstract :
A design for test method for improving dynamic supply current testing reliability on regenerative sense amplifier structures is described in this paper. This proposal uses a built-in current monitor to represent the supply current through the regenerative sense amplifier by a digital signature, externally analyzed by a digital tester. A fully differential fast comparator circuit has been used as a demonstrator to explore the effectiveness of the proposal. Different catastrophic faults at transistor level were considered and simulation results are discussed.
Keywords :
design for testability; DFT method; built-in current monitor; catastrophic faults; design for test method; digital signature; digital tester; dynamic current testing reliability; fully differential fast comparator circuit; regenerative sense amplifiers; transistor level faults; Circuit faults; Circuit simulation; Circuit testing; Coupling circuits; Current supplies; Electrical fault detection; Fault detection; Monitoring; Performance evaluation; Proposals;
Conference_Titel :
IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-8186-8123-3
DOI :
10.1109/IDDQ.1997.633009
