• DocumentCode
    1735725
  • Title

    WLR discussion group summary

  • Author

    Graas, Carole ; Achee, E.

  • Author_Institution
    Infineon Technologies
  • fYear
    1999
  • Firstpage
    129
  • Lastpage
    131
  • Abstract
    Discusses wafer level reliability.
  • Keywords
    Semiconductor materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 1999. IEEE International
  • Conference_Location
    Lake Tahoe, CA, USA
  • Print_ISBN
    0-7803-5649-7
  • Type

    conf

  • DOI
    10.1109/IRWS.1999.830573
  • Filename
    830573
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1735725