• DocumentCode
    1735810
  • Title

    A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing

  • Author

    Yamaguchi, Takahiro J. ; Kawabata, Masayuki ; Soma, Mani ; Ishida, Masahiro ; Sawami, Kiyotaka ; Uekusa, Kouichiro

  • Author_Institution
    Advantest Labs., Ltd., Sendai
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    This paper proposes a new method for measuring aperture jitter on an ADC output. It measures both the average ENOB loss and the worst-case ENOB loss due to aperture jitter. Because it adds only a negligible computation time to an existing ENOB test, it can also be used in an HV production environment without significantly increasing the overall test time.
  • Keywords
    analogue-digital conversion; jitter; ADC output; ENOB loss; ENOB testing; HV production environment; aperture jitter; Apertures; Clocks; Distortion measurement; Frequency measurement; Jitter; Sampling methods; Semiconductor device measurement; Signal to noise ratio; Spectral analysis; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700639
  • Filename
    4700639
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1735810