DocumentCode
1736107
Title
Launch-on-Shift-Capture Transition Tests
Author
Park, Intaik ; McCluskey, Edward J.
Author_Institution
Center for Reliable Comput., Stanford Univ., Stanford, CA
fYear
2008
Firstpage
1
Lastpage
9
Abstract
The two most popular transition tests are launch-on-shift (LOS) test and launch-on-capture (LOC) test. The LOS and LOC tests differ in their launch mechanisms, creating their own pros and cons. In this paper, new hybrids of LOS and LOC tests that launch transitions using both launch mechanisms are introduced. The new transition tests improved fault coverage without significant test length penalty. This paper presents the concepts and pattern generation methods of these new transition tests as well as experimental results that demonstrate the benefits of these tests.
Keywords
fault diagnosis; integrated circuit testing; fault coverage; launch mechanisms; launch-on-shift-capture transition tests; pattern generation methods; test length penalty; Circuit faults; Circuit testing; Clocks; Flip-flops; Lab-on-a-chip; Logic testing; Routing; System testing; Test pattern generators; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700648
Filename
4700648
Link To Document