Title :
Launch-on-Shift-Capture Transition Tests
Author :
Park, Intaik ; McCluskey, Edward J.
Author_Institution :
Center for Reliable Comput., Stanford Univ., Stanford, CA
Abstract :
The two most popular transition tests are launch-on-shift (LOS) test and launch-on-capture (LOC) test. The LOS and LOC tests differ in their launch mechanisms, creating their own pros and cons. In this paper, new hybrids of LOS and LOC tests that launch transitions using both launch mechanisms are introduced. The new transition tests improved fault coverage without significant test length penalty. This paper presents the concepts and pattern generation methods of these new transition tests as well as experimental results that demonstrate the benefits of these tests.
Keywords :
fault diagnosis; integrated circuit testing; fault coverage; launch mechanisms; launch-on-shift-capture transition tests; pattern generation methods; test length penalty; Circuit faults; Circuit testing; Clocks; Flip-flops; Lab-on-a-chip; Logic testing; Routing; System testing; Test pattern generators; Timing;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700648
