• DocumentCode
    1736223
  • Title

    The CDFII silicon detector

  • Author

    Thom, James A.

  • Author_Institution
    Fermi Nat. Accelerator Lab., Batavia, IL, USA
  • Volume
    1
  • fYear
    2004
  • Firstpage
    783
  • Abstract
    The CDFII silicon detector consists of 8 layers of double-sided silicon micro-strip sensors totalling 722,432 readout channels, making it one of the largest silicon detectors in present use by an HEP experiment. After two years of data taking, we report on our experience operating the complex device. The performance of the CDFII silicon detector is presented and its impact on physics analyses is discussed. We have already observed measurable effects from radiation damage. These results and their impact on the expected lifetime of the detector are briefly reviewed.
  • Keywords
    silicon radiation detectors; CDFII silicon detector; HEP experiment; SVXII ISL; complex device; double-sided silicon micro-strip sensors; measurable effects; physics analyses; radiation damage; readout channels; silicon paper number IM04-4544; Capacitors; Collaboration; Detectors; Gears; Large-scale systems; Maintenance; Optical noise; Physics; Silicon; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-8248-X
  • Type

    conf

  • DOI
    10.1109/IMTC.2004.1351163
  • Filename
    1351163