DocumentCode
1736415
Title
Analog Test Technology: Stable and Grounded, or Open Loop and Spurious?
Author
Purtell, Michael
Author_Institution
Intersil Corp., Milpitas, CA
fYear
2008
Firstpage
1
Lastpage
1
Abstract
The op-amp test loop used in the 1970s is still in use today. In the early 1980s, Matt Mahoney won best paper and honorable mention awards at this conference for ground breaking work in the area of analog and DSP based testing. While devices have evolved over the years in terms of speed, precision, and integration on SOC chips, almost all of the test techniques created by the early leaders are still in use today.
Keywords
analogue circuits; digital signal processing chips; operational amplifiers; system-on-chip; DSP based testing; SOC chips; analog based testing; analog test technology; op-amp test loop; Built-in self-test; Circuit testing; Digital signal processing chips; Filters; Image converters; Operational amplifiers; Probes; Radiofrequency amplifiers; System testing; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700662
Filename
4700662
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