• DocumentCode
    1736455
  • Title

    Analog Test Technology: Challenges Abound

  • Author

    Anderson, Thomas J.

  • Author_Institution
    Teradyne, Inc, San Jose, CA
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    When the author began his career as an analog test engineer in the semiconductor industry, testing was considered an annoying necessity. Today, test and assembly is the largest cost factor of a device, so it receives more attention, but is still a controversial subject. The author have encountered customers that feel some parameter testing takes too long, so they ignore the test altogether, even if required by standards committees, until they are hit with lawsuits and/or zero yield problems.
  • Keywords
    analogue integrated circuits; integrated circuit testing; analog test technology; digital signal processing; predictive measurement; semiconductor industry; Assembly; Bandwidth; Circuit testing; Costs; Digital signal processing; Electronic equipment testing; Electronics industry; Engineering profession; Instruments; Semiconductor device testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700664
  • Filename
    4700664