DocumentCode
1736455
Title
Analog Test Technology: Challenges Abound
Author
Anderson, Thomas J.
Author_Institution
Teradyne, Inc, San Jose, CA
fYear
2008
Firstpage
1
Lastpage
1
Abstract
When the author began his career as an analog test engineer in the semiconductor industry, testing was considered an annoying necessity. Today, test and assembly is the largest cost factor of a device, so it receives more attention, but is still a controversial subject. The author have encountered customers that feel some parameter testing takes too long, so they ignore the test altogether, even if required by standards committees, until they are hit with lawsuits and/or zero yield problems.
Keywords
analogue integrated circuits; integrated circuit testing; analog test technology; digital signal processing; predictive measurement; semiconductor industry; Assembly; Bandwidth; Circuit testing; Costs; Digital signal processing; Electronic equipment testing; Electronics industry; Engineering profession; Instruments; Semiconductor device testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700664
Filename
4700664
Link To Document