DocumentCode
1736480
Title
Will Test Compression Run Out of Gas?
Author
Goel, Sandeep Kumar ; Marinissen, Erik Jan
Author_Institution
Adv. Defect Screening Dept., LSI, Milpitas, CA
fYear
2008
Firstpage
1
Lastpage
1
Abstract
This panel addresses the question if test data compression was only a temporary fix, or a truly future-proof solution. Interoperability, low-power test, high-volume diagnosis, digital vs. analog testing, built-in self-test and low-cost ATEs will all be discussion in the scope of the future of test compression.
Keywords
built-in self test; circuit testing; data compression; analog testing; built-in self-test; data compression; digital testing; future-proof solution; high-volume diagnosis; low-power test; test compression; Automatic test pattern generation; Automatic testing; Built-in self-test; Costs; Hardware; Logic testing; Marine technology; Radio frequency; Technological innovation; Test data compression;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700666
Filename
4700666
Link To Document