Title :
Will Test Compression Run Out of Gas?
Author_Institution :
Cadence Design Syst., Inc., San Jose, CA
Abstract :
Test compression is one of the advancements in scan-based DFT/ATPG that can reduce the manufacturing test cost by significantly reducing both, the test application time and the required tester memory to store test data. It is quite typical to get a test compression ratio of 10-25X for most designs, and up to 100X or more for some of the designs and compression techniques. However, there are some practical and fundamental limits to how much compression can be achieved. To understand these limits, let us first look at how test compression works.
Keywords :
automatic test pattern generation; cost reduction; design for testability; manufacturing test cost reduction; scan-based ATPG; scan-based DFT; test compression; Automatic test pattern generation; Clocks; Costs; Design for testability; Logic design; Logic testing; Manufacturing; Pins; Sequential analysis; Test pattern generators;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700667
