• DocumentCode
    1736515
  • Title

    Will Test Compression Run Out Of Gas?

  • Author

    Pateras, Stephen

  • Author_Institution
    LogicVision, Inc., San Jose, CA
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. There are three key metrics that are often used when evaluating logic test methodologies: cost, quality and bring- up time. Although separate metrics, cost and quality are highly correlated and generally should be evaluated together. From a theoretical point of view, any logic test methodology can achieve close to any desired level of product quality if sufficient effort is used. The key therefore is to find the test methodology with the most efficient cost to quality trade-off. Using DPM to represent (the inverse of) quality, the goal is to achieve the steepest possible trade-off curve. In the eighties and nineties, ATPG replaced functional testing as it provided a significantly better cost to quality trade-off. Towards the beginning of this decade, ATPG compression began to replace pure ATPG usage as it provided an even better trade-off for larger designs.
  • Keywords
    automatic test pattern generation; logic testing; ATPG compression; automatic test pattern generation; functional testing; logic test methodology; product quality; quality trade-off; test compression; trade-off curve; Automatic test pattern generation; Bandwidth; Built-in self-test; Cost function; Debugging; Delay effects; Logic design; Logic testing; Silicon; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700668
  • Filename
    4700668