• DocumentCode
    1736607
  • Title

    Matching considerations in I/Q A/D converter pairs

  • Author

    Peach, Charles T. ; Law, Waisiu ; Beck, Douglas R. ; Helms, Ward J. ; Allstot, David J.

  • Author_Institution
    Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
  • Volume
    3
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Abstract
    Data characterizing the relationship between image reject ratio (IRR) and process mismatches in pipeline analog-to-digital converter (ADC) pairs is presented. The general high-level simulation model consists of two pipeline ADCs in parallel placed in an environment that resembles the I- and Q-channels of an RF receiver. Inserting normally distributed mismatches into the components of each ADC provides data that monitors any correlation between these mismatches and the IRR. This correlation was observed under a variety of conditions and calibration techniques. In particular, simulation evidence suggests that digital calibration techniques aimed at assisting linearity actually reduce the efficacy of I- and Q-channel image rejection.
  • Keywords
    analogue-digital conversion; calibration; circuit simulation; pipeline processing; I/Q A/D converter pairs; digital calibration techniques; high-level simulation model; image reject ratio; matching considerations; normally distributed mismatches; pipeline analog-to-digital converter pairs; process mismatches; Analog-digital conversion; Bandwidth; Calibration; Contracts; Design optimization; Image converters; Image sampling; Linearity; Pipelines; Radio frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
  • Print_ISBN
    0-7803-7448-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2002.1010181
  • Filename
    1010181