Title :
Locating stuck faults in analog circuits
Author :
Starzyk, J.A. ; Liu, D.
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Ohio Univ., Athens, OH, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
A new approach is proposed in this paper to detect the stuck faults in linear analog circuits. Ideal switches are inserted to indicate stuck-at, bridging and stuck-open locations. Then the resulting circuit is analyzed and stuck faults are directly identified. A recently developed method for multiple analog fault diagnosis is used eliminating a need for fault dictionary approach. The effect of locating stuck-at, bridging and stuck-open faults is modeled With full precision of resulting test conditions. An analog IC μA741 - is given as an example.
Keywords :
analogue integrated circuits; automatic testing; fault diagnosis; integrated circuit testing; bridging faults; ideal switches; linear analog circuits; multiple analog fault diagnosis; precision; stuck-at faults; stuck-open locations; test conditions; Analog circuits; Analog integrated circuits; Circuit analysis; Circuit faults; Circuit testing; Dictionaries; Electrical fault detection; Fault detection; Fault diagnosis; Switches;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1010183
