• DocumentCode
    1736791
  • Title

    Benchmarking Academic DFT Tools on the OpenSparc Microprocessor

  • Author

    Polian, Ilia ; Miller, Christian ; Engelke, Piet ; Nopper, Tobias ; Czutro, Alejandro ; Becker, Bernd

  • Author_Institution
    Inst. for Comput. Sci., Albert-Ludwigs-Univ., Freiburg
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The academia largely relies on two classes of circuits to benchmark its developments in the field of DFT. The first class are academic benchmarks such as ISCAS-85 [1], ISCAS-89 [2] and ITC-99 [3] circuits. They are reasonably old and thus significantly smaller than today´s realistic designs. Furthermore, their characteristics may not match the properties of recent designs. This might facilitate developments which are not useful for current circuits. For instance, ISCAS-85 circuits tend to have many reconvergen- cies and thus a huge number of paths through combinational logic. This triggered adding functionality handling recon- vergencies efficiently to academic test generation tools. This functionality may not be highly relevant in today´s practice
  • Keywords
    design for testability; logic design; microprocessor chips; ISCAS-85; ISCAS-89; ITC-99; OpenSparc microprocessor; academic test generation tools; design for testability; Application software; Benchmark testing; Circuit faults; Circuit simulation; Circuit synthesis; Circuit testing; Combinational circuits; Computational modeling; Microprocessors; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700677
  • Filename
    4700677