DocumentCode
1736791
Title
Benchmarking Academic DFT Tools on the OpenSparc Microprocessor
Author
Polian, Ilia ; Miller, Christian ; Engelke, Piet ; Nopper, Tobias ; Czutro, Alejandro ; Becker, Bernd
Author_Institution
Inst. for Comput. Sci., Albert-Ludwigs-Univ., Freiburg
fYear
2008
Firstpage
1
Lastpage
1
Abstract
The academia largely relies on two classes of circuits to benchmark its developments in the field of DFT. The first class are academic benchmarks such as ISCAS-85 [1], ISCAS-89 [2] and ITC-99 [3] circuits. They are reasonably old and thus significantly smaller than today´s realistic designs. Furthermore, their characteristics may not match the properties of recent designs. This might facilitate developments which are not useful for current circuits. For instance, ISCAS-85 circuits tend to have many reconvergen- cies and thus a huge number of paths through combinational logic. This triggered adding functionality handling recon- vergencies efficiently to academic test generation tools. This functionality may not be highly relevant in today´s practice
Keywords
design for testability; logic design; microprocessor chips; ISCAS-85; ISCAS-89; ITC-99; OpenSparc microprocessor; academic test generation tools; design for testability; Application software; Benchmark testing; Circuit faults; Circuit simulation; Circuit synthesis; Circuit testing; Combinational circuits; Computational modeling; Microprocessors; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700677
Filename
4700677
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