Title :
`Double´ subgraph isomorphism method for matching LSI chip images
Author :
Wang, Ji-Ren ; Li, Jie-gu
Author_Institution :
Dept. of Electron. Sci. & Technol., East China Normal Univ., Shanghai, China
Abstract :
The corresponding relations between two nodes isomorphically matched are searched from the region adjacency graph of segmented chip images. Heuristic information is extracted to improve the searching efficiency in the isomorphism matching. Special criteria of region similarity measure and matching figure of surrounding string are used to select starting nodes of isomorphism matching
Keywords :
computer vision; computerised pattern recognition; computerised picture processing; graph theory; heuristic programming; inspection; large scale integration; LSI chip images; computer vision; computerised picture processing; double subgraph isomorphism; heuristic information; image matching; isomorphism matching; pattern recognition; region adjacency graph; region similarity measure; searching efficiency; segmented chip images; surrounding string matching; Data mining; Image edge detection; Image processing; Image sampling; Image segmentation; Large scale integration; Lighting; Optical distortion; Pattern recognition; Semiconductor device measurement;
Conference_Titel :
Pattern Recognition, 1988., 9th International Conference on
Conference_Location :
Rome
Print_ISBN :
0-8186-0878-1
DOI :
10.1109/ICPR.1988.28409
