DocumentCode
1736840
Title
Back to the future for integrated diagnostics [electronic military systems]
Author
Price, Ronald
Author_Institution
Unisys Corp., Great Neck, NY, USA
fYear
1988
Firstpage
199
Lastpage
201
Abstract
The integrated-diagnostics methodology to correcting high failure ambiguity rates seeks to provide an effective mix of diagnostic capabilities to improve fault detection and isolation. A certain measure of success has been obtained in the reduction of failure ambiguity; however, considerable improvements may be attained using built-in-monitoring equipment (BIME) or a visually oriented performance-analysis workstation (VOPAW). These concepts are discussed
Keywords
automatic test equipment; automatic testing; electronic equipment testing; engineering workstations; fault location; military systems; user interfaces; built-in-monitoring equipment; electronic military systems; fault detection; fault isolation; high failure ambiguity rates; integrated diagnostics; visually oriented performance-analysis workstation; weapons; Automatic testing; Birth disorders; Computer aided engineering; Condition monitoring; Databases; Diagnostic expert systems; Fault detection; Intrusion detection; System testing; Weapons;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
Conference_Location
Minneapolis, MN
Type
conf
DOI
10.1109/AUTEST.1988.9610
Filename
9610
Link To Document