• DocumentCode
    1736852
  • Title

    Challenges in Scaling Software-Based Self-Testing to Multithreaded Chip Multiprocessors

  • Author

    Gizopoulos, Dimitris

  • Author_Institution
    Univ. of Piraeus, Piraeus
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Functional software-based self-testing (SBST) has been recently studied by leading academic research groups and applied by major microprocessor manufacturers as a complement to other classic structural testing techniques for microprocessors and processor-based SoCs. Is the SBST paradigm scalable to testing multithreaded chip multiprocessors (CMPs) and effectively detect faults not only in the functional components but also in the thread-specific and core interoperability logic? We study the challenges in scaling existing software-based self-test capital (uniprocessor self-test programs and self-test generation techniques) to real, multithreaded CMPs, like Sun´s OpenSPARC T1 and T2. Since this type of CMPs is built around well studied microprocessor cores of mature architecture (like SPARC v9 in the OpenSPARC case), tailoring, enhancing and scheduling of existing uniprocessor self-test programs can be an effective methodology for software-based self-test of CMPs.
  • Keywords
    automatic test software; microprocessor chips; multi-threading; system-on-chip; SPARC v9; Sun OpenSPARC T1; multithreaded chip multiprocessors; processor-based SoC; self-test generation techniques; software-based self-testing; structural testing techniques; uniprocessor self-test programs; Automatic testing; Built-in self-test; Fault detection; Job shop scheduling; Logic testing; Manufacturing processes; Microprocessors; Processor scheduling; Software testing; Sun;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700679
  • Filename
    4700679