DocumentCode :
1736923
Title :
Multiwavelets in solving nonlinear transport equations
Author :
Wang, K. ; Pan, G.W. ; Gilbert, B.K.
Author_Institution :
Arizona State Univ., Tempe, AZ, USA
Volume :
1
fYear :
2003
Firstpage :
355
Abstract :
Modeling and simulation of semiconductor devices deal with highly nonlinear equations, such as the drift-diffusion, hydrodynamic, and Boltzmann transport. equations. The multiwavelet based finite element method (MWFEM) is introduced and applied to 1D drift-diffusion device simulation. The mutual orthogonality of the multiwavelets in terms of a function and its first, second (and so forth) derivatives permits the derivation of an uncoupled algebraic system to solve the unknown coefficients of the functional expansion. As a result, the MWFEM tracks the unknown function along with its tendency. Hence, the spurious oscillation of the conventional FEM is eliminated. A numerical example demonstrates that the new method achieves high accuracy and stability for Poisson´s equation coupled with the nonlinear drift-diffusion equation with small to large Reynolds numbers. Versatility of the new algorithm encourages its use in complex systems of the Boltzmann, Wigner and non-equilibrium Green´s function based transport equations.
Keywords :
Boltzmann equation; Green´s function methods; Poisson equation; finite element analysis; semiconductor device models; wavelet transforms; 1D drift-diffusion device; Boltzmann equation; Boltzmann function; FEM; Poisson equation; Reynolds numbers; Wigner function; multiwavelet finite element method; nonequilibrium Green function; nonlinear transport equations; semiconductor device modeling; uncoupled algebraic system; wavelets; Artificial intelligence; Boltzmann equation; Boundary conditions; Charge carrier processes; Electron mobility; Finite element methods; Hydrodynamics; Nonlinear equations; Nonlinear systems; Spontaneous emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location :
Columbus, OH, USA
Print_ISBN :
0-7803-7846-6
Type :
conf
DOI :
10.1109/APS.2003.1217470
Filename :
1217470
Link To Document :
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