Title :
RF transceiver parameter identification using regressive models
Author :
Khereddine, Rafik ; Simeu, Emmanuel ; Mir, Salvador
Author_Institution :
TIMA Lab., Grenoble
Abstract :
In this paper, we consider the nonlinear system modelling problem for on-chip testing of embedded mixed-signal systems. Behavioural modelling is proposed to characterize RF transceiver, in terms of input and output signals using simplified mathematical expressions. A Situation-Dependent AutoRegressive model with exogenous variable (SDARX) is introduced to approximate the conventional Nonlinear-ARX (NARX). The parameter search space is divided into a linear weight subspace and the nonlinear parameter subspace. A nonlinear parameter estimation strategy combines the Levenberg-Marquardt method (LMM) for nonlinear parameter optimization and the least- square method (LSM) for linear parameter estimation.
Keywords :
autoregressive processes; least mean squares methods; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; transceivers; Levenberg-Marquardt method; RF transceiver parameter identification; conventional nonlinear-ARX; embedded mixed-signal system; exogenous variable; least-square method; linear parameter estimation; nonlinear parameter optimization; on-chip testing; situation-dependent autoregressive model; Circuit faults; Circuit testing; Fault detection; Fault diagnosis; Nonlinear systems; Parameter estimation; Radio frequency; Radiofrequency identification; System-on-a-chip; Transceivers; Behavioural modelling of RF transceiver; Levenberg Marquardt method; NARX model; Parameter identification; least squares method;
Conference_Titel :
Design and Technology of Integrated Systems in Nanoscale Era, 2008. DTIS 2008. 3rd International Conference on
Conference_Location :
Tozeur
Print_ISBN :
978-1-4244-1576-2
Electronic_ISBN :
978-1-4244-1577-9
DOI :
10.1109/DTIS.2008.4540208
