Title :
NoC Reconfiguration for Utilizing the Largest Fault-free Connected Sub-structure
Author :
Alaghi, Armin ; Sedghi, Mahshid ; Karimi, Naghmeh ; Navabi, Zainalabedin
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Tehran, Tehran
Abstract :
This paper proposes an offline test strategy for finding the largest fault-free connected sub-structure of a mesh-based NoC. Faulty switch ports are found by flooding the NoC with test packets. Then, NoC routers are reconfigured according to the degraded NoC structure to route incoming packets.
Keywords :
fault trees; logic testing; network routing; network-on-chip; NoC routers; NoC testing; fault-free connected substructure; faulty switch ports; mesh-based NoC reconfiguration; Circuit faults; Circuit testing; Degradation; Fault detection; Floods; Network-on-a-chip; Packet switching; Routing; Space exploration; Switches;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700688
