Title :
VLSI Test Exercise Courses for Students in EE Department
Author :
Komatsu, Satoshi
Author_Institution :
VLSI Design & Educ. Center, Univ. of Tokyo, Tokyo
Abstract :
In the deep sub-micron technology era, test of VLSI chips becomes much more important in the education of EE department. This paper reports a new trial of VLSI test exercise course in University of Tokyo.
Keywords :
VLSI; electrical engineering education; integrated circuit design; Electrical Engineering Department; University of Tokyo; VLSI test exercise courses; Circuit testing; Design engineering; Educational technology; Fabrication; Hardware; Particle measurements; System testing; System-on-a-chip; Velocity measurement; Very large scale integration;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700689
