Title : 
A hybrid (logic+I/sub DDQ/) testing strategy using an iterative bridging fault filtering scheme
         
        
            Author : 
Tzuhao Chen ; Hajj, I.N.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
         
        
        
        
        
            Abstract : 
In this paper we propose a new hybrid (logic+I/sub DDQ/) testing strategy for efficient bridging fault (BF) detection. In our strategy, logic and I/sub DDQ/ testings are applied in sequence so that BFs that can be detected by the logic testing need not be targeted by the I/sub DDQ/ testing. The logic test generation is done via an iterative BF filtering in which fault coverage is maximized through test set augmentation. As a result only a small number of BFs need to be targeted by the I/sub DDQ/ test generator. Experiments show that this approach is capable of reaching very high BF coverage with a composite (logic+I/sub DDQ/) test set with very few I/sub DDQ/ vectors.
         
        
            Keywords : 
logic testing; I/sub DDQ/ test generator; bridging fault detection; fault coverage; hybrid testing strategy; iterative bridging fault filtering scheme; logic test generation; test set augmentation; Circuit faults; Circuit testing; Filtering; Integrated circuit testing; Logic testing; Manufacturing; Sequential analysis; Sequential circuits; VHF circuits; Very large scale integration;
         
        
        
        
            Conference_Titel : 
IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on
         
        
            Conference_Location : 
Washington, DC, USA
         
        
            Print_ISBN : 
0-8186-8123-3
         
        
        
            DOI : 
10.1109/IDDQ.1997.633015