• DocumentCode
    1737143
  • Title

    A hybrid (logic+I/sub DDQ/) testing strategy using an iterative bridging fault filtering scheme

  • Author

    Tzuhao Chen ; Hajj, I.N.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • fYear
    1997
  • Firstpage
    63
  • Lastpage
    67
  • Abstract
    In this paper we propose a new hybrid (logic+I/sub DDQ/) testing strategy for efficient bridging fault (BF) detection. In our strategy, logic and I/sub DDQ/ testings are applied in sequence so that BFs that can be detected by the logic testing need not be targeted by the I/sub DDQ/ testing. The logic test generation is done via an iterative BF filtering in which fault coverage is maximized through test set augmentation. As a result only a small number of BFs need to be targeted by the I/sub DDQ/ test generator. Experiments show that this approach is capable of reaching very high BF coverage with a composite (logic+I/sub DDQ/) test set with very few I/sub DDQ/ vectors.
  • Keywords
    logic testing; I/sub DDQ/ test generator; bridging fault detection; fault coverage; hybrid testing strategy; iterative bridging fault filtering scheme; logic test generation; test set augmentation; Circuit faults; Circuit testing; Filtering; Integrated circuit testing; Logic testing; Manufacturing; Sequential analysis; Sequential circuits; VHF circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-8186-8123-3
  • Type

    conf

  • DOI
    10.1109/IDDQ.1997.633015
  • Filename
    633015