• DocumentCode
    1737180
  • Title

    An Efficient Secure Scan Design for an SoC Embedding AES Core

  • Author

    Song, Jaehoon ; Jung, Taejin ; Lee, Junseop ; Jeong, Hyeran ; Kim, Byeongjin ; Park, Sungju

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Hanyang Univ.
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    This poster presents an efficient secure scan design based on a fake key to protect a secret key from scan-based side channel attack. This technique targeted for an SoC embedding an Advanced Encryption Standard (AES) core can be adopted without requiring any modification to the functional body of the IP core, thus overheads for area, timing, and power are negligible while preserving the compatibility with the IEEE1149.1 standard.
  • Keywords
    IEEE standards; cryptography; design for testability; system-on-chip; IEEE1149.1 standard; IP core; advanced encryption standard; design for test; secure scan design; side channel attack; Computer science; Cryptography; Design engineering; Design for testability; Hardware; Information retrieval; Power engineering and energy; Protection; Testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700693
  • Filename
    4700693