Title :
Diagnosis of Mask-Effect Multiple Timing Faults in Scan Chains
Author :
Ye, Jing ; Wang, Fei ; Hu, Yu ; Li, Xiaowei
Author_Institution :
Key Lab. of Comput. Syst. & Archit., Inst. of Comput. Technol., Beijing
Abstract :
A deterministic diagnosis method for multiple timing faults in scan chains is proposed. Compared to prior work, our approach can diagnose mask-effect multiple timing faults as well as conventional mixed multiple timing faults. Experimental results on ISCAS´89 benchmark circuits demonstrate that the average diagnosis resolution of two faults is less than 3.
Keywords :
benchmark testing; circuit testing; fault diagnosis; benchmark circuits; fault diagnosis; mask effect; multiple timing faults; scan chains; Circuit faults; Computer architecture; Content addressable storage; Dictionaries; Fault detection; Fault diagnosis; Laboratories; Test pattern generators; Testing; Timing;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700694
